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[ subject:"Compound semiconductors" ]
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Reliability and radiation effects in...
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Johnston, Allan
Reliability and radiation effects in compound semiconductors[electronic resource] /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
杜威分類號:
621.38152
書名/作者:
Reliability and radiation effects in compound semiconductors/ Allan Johnston.
作者:
Johnston, Allan
出版者:
Singapore ; : World Scientific Pub. Co.,, c2010.
面頁冊數:
xii, 363 p. : : ill.
標題:
Compound semiconductors - Reliability.
標題:
Compound semiconductors - Effect of radiation on.
ISBN:
9789814277112 (electronic bk.)
書目註:
Includes bibliographical references and index.
電子資源:
http://www.worldscientific.com/worldscibooks/10.1142/7331#t=toc
Reliability and radiation effects in compound semiconductors[electronic resource] /
Johnston, Allan
Reliability and radiation effects in compound semiconductors
[electronic resource] /Allan Johnston. - Singapore ;World Scientific Pub. Co.,c2010. - xii, 363 p. :ill.
Includes bibliographical references and index.
Electronic reproduction.
Singapore :
World Scientific Publishing Co.,
2010.
System requirements: Adobe Acrobat Reader.
ISBN: 9789814277112 (electronic bk.)Subjects--Topical Terms:
486793
Compound semiconductors
--Reliability.
LC Class. No.: TK7871.99.C65
Dewey Class. No.: 621.38152
Reliability and radiation effects in compound semiconductors[electronic resource] /
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http://www.worldscientific.com/worldscibooks/10.1142/7331#t=toc
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