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Transmission electron microscopy[ele...

Carter, C. Barry.

Transmission electron microscopy[electronic resource] :diffraction, imaging, and spectrometry /

紀錄類型:	書目-電子資源 : Monograph/item
杜威分類號:	502.825
書名/作者:	Transmission electron microscopy : diffraction, imaging, and spectrometry // edited by C. Barry Carter, David B. Williams.
其他作者:	Carter, C. Barry.
出版者:	Cham : : Springer International Publishing :, 2016.
面頁冊數:	xxxiii, 518 p. : : ill., digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Transmission electron microscopy.
標題:	Materials Science.
標題:	Characterization and Evaluation of Materials.
標題:	Nanoscale Science and Technology.
標題:	Spectroscopy/Spectrometry.
標題:	Solid State Physics.
標題:	Spectroscopy and Microscopy.
標題:	Continuum Mechanics and Mechanics of Materials.
ISBN:	9783319266510
ISBN:	9783319266497
內容註:	Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS.
電子資源:	http://dx.doi.org/10.1007/978-3-319-26651-0

Transmission electron microscopy[electronic resource] :diffraction, imaging, and spectrometry /
Transmission electron microscopydiffraction, imaging, and spectrometry /[electronic resource] :edited by C. Barry Carter, David B. Williams. - Cham :Springer International Publishing :2016. - xxxiii, 518 p. :ill., digital ;24 cm.

Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS.

ISBN: 9783319266510

Standard No.: 10.1007/978-3-319-26651-0doiSubjects--Topical Terms:

386312
Transmission electron microscopy.

LC Class. No.: QH212.T7

Dewey Class. No.: 502.825

Transmission electron microscopy[electronic resource] :diffraction, imaging, and spectrometry /
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505 0 $a Foreword by Sir John Meurig Thomas -- 1. Electron Sources -- 2. In Situ and Operando -- 3. Electron Diffraction and Phase Identification -- 4. Convergent-Beam Diffraction: Symmetry and Large-Angle Patterns -- 5. Electron crystallography, charge-density mapping and nanodiffraction -- 6. Digital Micrograph -- 7. Electron waves, interference & coherence -- 8. Electron Holography -- 9. Focal-Series Reconstruction -- 10. Direct Methods For Image Interpretation -- 11. Imaging in the STEM -- 12. Electron Tomography -- 13. Energy-Filtered Transmission Electron Microscopy -- 14. Calculation of Electron Energy-Loss Spectra -- 15. Electron Diffraction & X-Ray Excitation -- 16. X-Ray and Electron Energy-Loss Spectral Imaging -- 17. Practical Aspects and Advanced Applications of XEDS.
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650 2 4 $a Spectroscopy/Spectrometry. $3 464483
650 2 4 $a Solid State Physics. $3 463873
650 2 4 $a Spectroscopy and Microscopy. $3 463786
650 2 4 $a Continuum Mechanics and Mechanics of Materials. $3 463797
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700 1 $a Williams, David B. $3 669467
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