Metrology and physical mechanisms in...
Celano, Umberto.

 

  • Metrology and physical mechanisms in new generation ionic devices[electronic resource] /
  • 紀錄類型: 書目-電子資源 : Monograph/item
    杜威分類號: 621.38152
    書名/作者: Metrology and physical mechanisms in new generation ionic devices/ by Umberto Celano.
    作者: Celano, Umberto.
    出版者: Cham : : Springer International Publishing :, 2016.
    面頁冊數: xxiv, 175 p. : : ill. (some col.), digital ;; 24 cm.
    Contained By: Springer eBooks
    標題: Thin films.
    標題: Electronic apparatus and appliances.
    標題: Metrology.
    標題: Nonvolatile random-access memory.
    標題: Physics.
    標題: Spectroscopy and Microscopy.
    標題: Nanotechnology and Microengineering.
    標題: Characterization and Evaluation of Materials.
    ISBN: 9783319395319
    ISBN: 9783319395302
    內容註: Introduction -- Filamentary-Based Resistive Switching -- Nanoscaled Electrical Characterization -- Conductive Filaments: Formation, Observation and Manipulation -- Three-Dimensional Filament Observation -- Reliability Threats in CBRAM -- Conclusions and Outlook.
    摘要、提要註: The thesis presents the first direct observations of the 3D-shape, size and electrical properties of nanoscale filaments, made possible by a new Scanning Probe Microscopy-based tomography technique referred to as scalpel SPM. Using this innovative technology and nm-scale observations, the author achieves essential insights into the filament formation mechanisms, improves the understanding required for device optimization, and experimentally observes phenomena that had previously been only theoretically proposed.
    電子資源: http://dx.doi.org/10.1007/978-3-319-39531-9
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