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Advanced transmission electron microscopy[electronic resource] :applications to nanomaterials /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	502.825
書名/作者:	Advanced transmission electron microscopy : applications to nanomaterials // edited by Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal.
其他作者:	Deepak, Francis Leonard.
出版者:	Cham : : Springer International Publishing :, 2015.
面頁冊數:	xii, 272 p. : : ill. (some col.), digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Transmission electron microscopy.
標題:	Nanostructured materials - Nondestructive testing.
標題:	Materials Science.
標題:	Optical and Electronic Materials.
標題:	Nanotechnology and Microengineering.
標題:	Nanoscale Science and Technology.
標題:	Nanochemistry.
ISBN:	9783319151779 (electronic bk.)
ISBN:	9783319151762 (paper)
內容註:	Preface -- Introduction to TEM, HRTEM and aberration corrected microscopy -- Electron diffraction and crystal orientation phase mapping under scanning transmission electron microscopy -- Advanced Electron Microscopy in the Study of Multi metallic Nanoparticles -- Zeolites and Ordered Mesoporous materials under the electron microscope -- Local TEM spectroscopic studies on carbon- and boron nitride-based nanomaterials -- 3D-nanometric analyses via electron tomography: application to nanomaterials -- In situ TEM of carbon nanotubes -- Physical characterization of nanomaterials in dispersion by transmission electron microscopy in a regulatory framework.
摘要、提要註:	This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials. The applications described include both inorganic nanomaterials as well as organic nanomaterials.
電子資源:	http://dx.doi.org/10.1007/978-3-319-15177-9

Advanced transmission electron microscopy[electronic resource] :applications to nanomaterials /
Advanced transmission electron microscopyapplications to nanomaterials /[electronic resource] :edited by Francis Leonard Deepak, Alvaro Mayoral, Raul Arenal. - Cham :Springer International Publishing :2015. - xii, 272 p. :ill. (some col.), digital ;24 cm.

Preface -- Introduction to TEM, HRTEM and aberration corrected microscopy -- Electron diffraction and crystal orientation phase mapping under scanning transmission electron microscopy -- Advanced Electron Microscopy in the Study of Multi metallic Nanoparticles -- Zeolites and Ordered Mesoporous materials under the electron microscope -- Local TEM spectroscopic studies on carbon- and boron nitride-based nanomaterials -- 3D-nanometric analyses via electron tomography: application to nanomaterials -- In situ TEM of carbon nanotubes -- Physical characterization of nanomaterials in dispersion by transmission electron microscopy in a regulatory framework.

This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials. The applications described include both inorganic nanomaterials as well as organic nanomaterials.

ISBN: 9783319151779 (electronic bk.)

Standard No.: 10.1007/978-3-319-15177-9doiSubjects--Topical Terms:

386312
Transmission electron microscopy.

LC Class. No.: QH212.T7

Dewey Class. No.: 502.825

Advanced transmission electron microscopy[electronic resource] :applications to nanomaterials /
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505 0 $a Preface -- Introduction to TEM, HRTEM and aberration corrected microscopy -- Electron diffraction and crystal orientation phase mapping under scanning transmission electron microscopy -- Advanced Electron Microscopy in the Study of Multi metallic Nanoparticles -- Zeolites and Ordered Mesoporous materials under the electron microscope -- Local TEM spectroscopic studies on carbon- and boron nitride-based nanomaterials -- 3D-nanometric analyses via electron tomography: application to nanomaterials -- In situ TEM of carbon nanotubes -- Physical characterization of nanomaterials in dispersion by transmission electron microscopy in a regulatory framework.
520 $a This book highlights the current understanding of materials in the context of new and continuously emerging techniques in the field of electron microscopy. The authors present applications of electron microscopic techniques in characterizing various well-known & new nanomaterials. The applications described include both inorganic nanomaterials as well as organic nanomaterials.
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