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Ellipsometry of functional organic s...

Eichhorn, Klaus-Jochen.

Ellipsometry of functional organic surfaces and films[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	620.11295
書名/作者:	Ellipsometry of functional organic surfaces and films/ edited by Karsten Hinrichs, Klaus-Jochen Eichhorn.
其他作者:	Hinrichs, Karsten.
出版者:	Berlin, Heidelberg : : Springer Berlin Heidelberg :, 2014.
面頁冊數:	xxi, 363 p. : : ill. (some col.), digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Ellipsometry.
標題:	Physics.
標題:	Surface and Interface Science, Thin Films.
標題:	Surfaces and Interfaces, Thin Films.
標題:	Physical Chemistry.
標題:	Optics, Optoelectronics, Plasmonics and Optical Devices.
標題:	Characterization and Evaluation of Materials.
ISBN:	9783642401282 (electronic bk.)
ISBN:	9783642401275 (paper)
電子資源:	http://dx.doi.org/10.1007/978-3-642-40128-2

Ellipsometry of functional organic surfaces and films[electronic resource] /
Ellipsometry of functional organic surfaces and films[electronic resource] /edited by Karsten Hinrichs, Klaus-Jochen Eichhorn. - Berlin, Heidelberg :Springer Berlin Heidelberg :2014. - xxi, 363 p. :ill. (some col.), digital ;24 cm. - Springer series in surface sciences,v.520931-5195 ;. - Springer series in surface sciences ;48..

ISBN: 9783642401282 (electronic bk.)Subjects--Topical Terms:

611825
Ellipsometry.

Dewey Class. No.: 620.11295

Ellipsometry of functional organic surfaces and films[electronic resource] /
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650 2 4 $a Characterization and Evaluation of Materials. $3 463765
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