Zalevsky, Zeev.

Overview

Works:	1 works in 1 publications in 1 languages

Titles

New approaches to image processing based failure analysis of nano-scale ULSI devices[electronic resource] / by: Gur, Eran.; Livshits, Pavel.; Zalevsky, Zeev. (Language materials, printed)

Integrated nanophotonic devices[electronic resource] / by: Abdulhalim, Ibrahim.; Zalevsky, Zeev. (Language materials, printed)

Subjects