大葉大學圖書館 |

Comparators in nanometer CMOS technology[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	621.3815
書名/作者:	Comparators in nanometer CMOS technology/ by Bernhard Goll, Horst Zimmermann.
作者:	Goll, Bernhard.
其他作者:	Zimmermann, Horst.
出版者:	Berlin, Heidelberg : : Springer Berlin Heidelberg :, 2015.
面頁冊數:	xiv, 250 p. : : ill. (some col.), digital ;; 24 cm.
Contained By:	Springer eBooks
標題:	Analog CMOS integrated circuits.
標題:	Microelectronics.
標題:	Engineering.
標題:	Circuits and Systems.
標題:	Nuclear Physics, Heavy Ions, Hadrons.
標題:	Nanotechnology and Microengineering.
標題:	Electronics and Microelectronics, Instrumentation.
標題:	Characterization and Evaluation of Materials.
ISBN:	9783662444825 (electronic bk.)
ISBN:	9783662444818 (paper)
內容註:	Fundamentals of clocked, regenerative comparators -- State-of-the-art nanometer CMOS -- Measurement circuits and setup -- Comparators in 120 nm CMOS -- Comparators in 65 nm CMOS -- Conclusions and comparison.
摘要、提要註:	This book covers the complete spectrum of the fundamentals of clocked, regenerative comparators, their state-of-the-art, advanced CMOS technologies, innovative comparators inclusive circuit aspects, their characterization and properties. Starting from the basics of comparators and the transistor characteristics in nanometer CMOS, seven high-performance comparators developed by the authors in 120nm and 65nm CMOS are described extensively. Methods and measurement circuits for the characterization of advanced comparators are introduced. A synthesis of the largely differing aspects of demands on modern comparators and the properties of devices being available in nanometer CMOS, which are posed by the so-called nanometer hell of physics, is accomplished. The book summarizes the state of the art in integrated comparators. Advanced measurement circuits for characterization will be introduced as well as the method of characterization by bit-error analysis usually being used for characterization of optical receivers. The book is compact, and the graphical quality of the illustrations is outstanding. This book is written for engineers and researchers in industry as well as scientists and Ph.D students at universities. It is also recommendable to graduate students specializing on nanoelectronics and microelectronics or circuit design.
電子資源:	http://dx.doi.org/10.1007/978-3-662-44482-5

Comparators in nanometer CMOS technology[electronic resource] /
Goll, Bernhard.

Comparators in nanometer CMOS technology[electronic resource] /by Bernhard Goll, Horst Zimmermann. - Berlin, Heidelberg :Springer Berlin Heidelberg :2015. - xiv, 250 p. :ill. (some col.), digital ;24 cm. - Springer series in advanced microelectronics,v.501437-0387 ;. - Springer series in advanced microelectronics ;33..

Fundamentals of clocked, regenerative comparators -- State-of-the-art nanometer CMOS -- Measurement circuits and setup -- Comparators in 120 nm CMOS -- Comparators in 65 nm CMOS -- Conclusions and comparison.

This book covers the complete spectrum of the fundamentals of clocked, regenerative comparators, their state-of-the-art, advanced CMOS technologies, innovative comparators inclusive circuit aspects, their characterization and properties. Starting from the basics of comparators and the transistor characteristics in nanometer CMOS, seven high-performance comparators developed by the authors in 120nm and 65nm CMOS are described extensively. Methods and measurement circuits for the characterization of advanced comparators are introduced. A synthesis of the largely differing aspects of demands on modern comparators and the properties of devices being available in nanometer CMOS, which are posed by the so-called nanometer hell of physics, is accomplished. The book summarizes the state of the art in integrated comparators. Advanced measurement circuits for characterization will be introduced as well as the method of characterization by bit-error analysis usually being used for characterization of optical receivers. The book is compact, and the graphical quality of the illustrations is outstanding. This book is written for engineers and researchers in industry as well as scientists and Ph.D students at universities. It is also recommendable to graduate students specializing on nanoelectronics and microelectronics or circuit design.

ISBN: 9783662444825 (electronic bk.)

Standard No.: 10.1007/978-3-662-44482-5doiSubjects--Topical Terms:

602755
Analog CMOS integrated circuits.

LC Class. No.: TK7874.654

Dewey Class. No.: 621.3815

Comparators in nanometer CMOS technology[electronic resource] /
LDR:02590nam a2200325 a 4500 001 424689
003 DE-He213
005 20150603160743.0
006 m d
007 cr nn 008maaau
008 151119s2015 gw s 0 eng d
020 $a 9783662444825 (electronic bk.)
020 $a 9783662444818 (paper)
024 7 $a 10.1007/978-3-662-44482-5 $2 doi
035 $a 978-3-662-44482-5
040 $a GP $c GP
041 0 $a eng
050 4 $a TK7874.654
072 7 $a TJFC $2 bicssc
072 7 $a TEC008010 $2 bisacsh
082 0 4 $a 621.3815 $2 23
090 $a TK7874.654 $b .G626 2015
100 1 $a Goll, Bernhard. $3 602753
245 1 0 $a Comparators in nanometer CMOS technology $h [electronic resource] / $c by Bernhard Goll, Horst Zimmermann.
260 $a Berlin, Heidelberg : $b Springer Berlin Heidelberg : $b Imprint: Springer, $c 2015.
300 $a xiv, 250 p. : $b ill. (some col.), digital ; $c 24 cm.
490 1 $a Springer series in advanced microelectronics, $x 1437-0387 ; $v v.50
505 0 $a Fundamentals of clocked, regenerative comparators -- State-of-the-art nanometer CMOS -- Measurement circuits and setup -- Comparators in 120 nm CMOS -- Comparators in 65 nm CMOS -- Conclusions and comparison.
520 $a This book covers the complete spectrum of the fundamentals of clocked, regenerative comparators, their state-of-the-art, advanced CMOS technologies, innovative comparators inclusive circuit aspects, their characterization and properties. Starting from the basics of comparators and the transistor characteristics in nanometer CMOS, seven high-performance comparators developed by the authors in 120nm and 65nm CMOS are described extensively. Methods and measurement circuits for the characterization of advanced comparators are introduced. A synthesis of the largely differing aspects of demands on modern comparators and the properties of devices being available in nanometer CMOS, which are posed by the so-called nanometer hell of physics, is accomplished. The book summarizes the state of the art in integrated comparators. Advanced measurement circuits for characterization will be introduced as well as the method of characterization by bit-error analysis usually being used for characterization of optical receivers. The book is compact, and the graphical quality of the illustrations is outstanding. This book is written for engineers and researchers in industry as well as scientists and Ph.D students at universities. It is also recommendable to graduate students specializing on nanoelectronics and microelectronics or circuit design.
650 0 $a Analog CMOS integrated circuits. $3 602755
650 0 $a Microelectronics. $3 183856
650 1 4 $a Engineering. $3 372756
650 2 4 $a Circuits and Systems. $3 463473
650 2 4 $a Nuclear Physics, Heavy Ions, Hadrons. $3 463947
650 2 4 $a Nanotechnology and Microengineering. $3 463475
650 2 4 $a Electronics and Microelectronics, Instrumentation. $3 463474
650 2 4 $a Characterization and Evaluation of Materials. $3 463765
700 1 $a Zimmermann, Horst. $3 602754
710 2 $a SpringerLink (Online service) $3 463450
773 0 $t Springer eBooks
830 0 $a Springer series in advanced microelectronics ; $v 33. $3 464642
856 4 0 $u http://dx.doi.org/10.1007/978-3-662-44482-5
950 $a Engineering (Springer-11647)