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Coupled multiscale simulation and op...
Gunther, Michael.

 

  • Coupled multiscale simulation and optimization in nanoelectronics[electronic resource] /
  • 紀錄類型: 書目-語言資料,印刷品 : Monograph/item
    杜威分類號: 621.3815
    書名/作者: Coupled multiscale simulation and optimization in nanoelectronics/ edited by Michael Gunther.
    其他作者: Gunther, Michael.
    出版者: Berlin, Heidelberg : : Springer Berlin Heidelberg :, 2015.
    面頁冊數: xvii, 565 p. : : ill., digital ;; 24 cm.
    Contained By: Springer eBooks
    標題: Nanoelectronics.
    標題: Multiscale modeling.
    標題: Mathematics.
    標題: Computational Science and Engineering.
    標題: Nanotechnology and Microengineering.
    標題: Appl.Mathematics/Computational Methods of Engineering.
    標題: Nanoscale Science and Technology.
    ISBN: 9783662466728 (electronic bk.)
    ISBN: 9783662466711 (paper)
    摘要、提要註: Designing complex integrated circuits relies heavily on mathematical methods and calls for suitable simulation and optimization tools. The current design approach involves simulations and optimizations in different physical domains (device, circuit, thermal, electromagnetic) and in a range of electrical engineering disciplines (logic, timing, power, crosstalk, signal integrity, system functionality) COMSON was a Marie Curie Research Training Network created to meet these new scientific and training challenges by (a) developing new descriptive models that take these mutual dependencies into account, (b) combining these models with existing circuit descriptions in new simulation strategies, and (c) developing new optimization techniques that will accommodate new designs. The book presents the main project results in the fields of PDAE modeling and simulation, model order reduction techniques and optimization, based on merging the know-how of three major European semiconductor companies with the combined expertise of university groups specialized in developing suitable mathematical models, numerical schemes and e-learning facilities. In addition, a common Demonstrator Platform for testing mathematical methods and approaches was created to assess whether they are capable of addressing the industry's problems, and to educate young researchers by providing hands-on experience with state-of-the-art problems.
    電子資源: http://dx.doi.org/10.1007/978-3-662-46672-8
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