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[ subject:"Amorphous semiconductors" ]
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Trap level spectroscopy in amorphous...
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Mikla, Victor I.
Trap level spectroscopy in amorphous semiconductors[electronic resource] /
紀錄類型:
書目-語言資料,印刷品 : Monograph/item
杜威分類號:
537.6223
書名/作者:
Trap level spectroscopy in amorphous semiconductors/ Viktor I. Mikla.
作者:
Mikla, Victor I.
出版者:
Oxford : : Elsevier,, 2010.
面頁冊數:
1 online resource.
標題:
Amorphous semiconductors - Spectra.
標題:
Amorphous semiconductors - Defects
標題:
Deep level transient spectroscopy.
ISBN:
9780123847157
ISBN:
012384715X
內容註:
Thermally stimulated depolarization currents in amorphous chalcogenides -- Carrier transport processes in amorphous solids -- Time-of-flight experiments in amorphous chalcogenide semiconductors -- Xerographic spectroscopy of states in mobility gap -- Photoinduced effects on states in the mobility gap -- Spectroscopic studies of gap states and laser-induced structural transformations in se-based as-free amorphous semiconductors.
摘要、提要註:
Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most�common spectroscopic techniques Discusses the advantages and disadvantages of each technique.
電子資源:
http://www.sciencedirect.com/science/book/9780123847157
Trap level spectroscopy in amorphous semiconductors[electronic resource] /
Mikla, Victor I.
Trap level spectroscopy in amorphous semiconductors
[electronic resource] /Viktor I. Mikla. - Oxford :Elsevier,2010. - 1 online resource.
Thermally stimulated depolarization currents in amorphous chalcogenides -- Carrier transport processes in amorphous solids -- Time-of-flight experiments in amorphous chalcogenide semiconductors -- Xerographic spectroscopy of states in mobility gap -- Photoinduced effects on states in the mobility gap -- Spectroscopic studies of gap states and laser-induced structural transformations in se-based as-free amorphous semiconductors.
Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most�common spectroscopic techniques Discusses the advantages and disadvantages of each technique.
ISBN: 9780123847157
Source: 1098708:10929071Elsevier Science & Technologyhttp://www.sciencedirect.comSubjects--Topical Terms:
445823
Amorphous semiconductors
--Spectra.Index Terms--Genre/Form:
336502
Electronic books.
LC Class. No.: QC611.8.A5 / M55 2010
Dewey Class. No.: 537.6223
Trap level spectroscopy in amorphous semiconductors[electronic resource] /
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