大葉大學圖書館 |

登入

回首頁 到查詢結果 [ subject:"Amorphous semiconductors" ]

Trap level spectroscopy in amorphous...

Mikla, Victor I.

Trap level spectroscopy in amorphous semiconductors[electronic resource] /

紀錄類型:	書目-語言資料,印刷品 : Monograph/item
杜威分類號:	537.6223
書名/作者:	Trap level spectroscopy in amorphous semiconductors/ Viktor I. Mikla.
作者:	Mikla, Victor I.
出版者:	Oxford : : Elsevier,, 2010.
面頁冊數:	1 online resource.
標題:	Amorphous semiconductors - Spectra.
標題:	Amorphous semiconductors - Defects
標題:	Deep level transient spectroscopy.
ISBN:	9780123847157
ISBN:	012384715X
內容註:	Thermally stimulated depolarization currents in amorphous chalcogenides -- Carrier transport processes in amorphous solids -- Time-of-flight experiments in amorphous chalcogenide semiconductors -- Xerographic spectroscopy of states in mobility gap -- Photoinduced effects on states in the mobility gap -- Spectroscopic studies of gap states and laser-induced structural transformations in se-based as-free amorphous semiconductors.
摘要、提要註:	Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most�common spectroscopic techniques Discusses the advantages and disadvantages of each technique.
電子資源:	http://www.sciencedirect.com/science/book/9780123847157

Trap level spectroscopy in amorphous semiconductors[electronic resource] /
Mikla, Victor I.

Trap level spectroscopy in amorphous semiconductors[electronic resource] /Viktor I. Mikla. - Oxford :Elsevier,2010. - 1 online resource.

Thermally stimulated depolarization currents in amorphous chalcogenides -- Carrier transport processes in amorphous solids -- Time-of-flight experiments in amorphous chalcogenide semiconductors -- Xerographic spectroscopy of states in mobility gap -- Photoinduced effects on states in the mobility gap -- Spectroscopic studies of gap states and laser-induced structural transformations in se-based as-free amorphous semiconductors.

Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most�common spectroscopic techniques Discusses the advantages and disadvantages of each technique.

ISBN: 9780123847157

Source: 1098708:10929071Elsevier Science & Technologyhttp://www.sciencedirect.comSubjects--Topical Terms:

445823
Amorphous semiconductors
--Spectra.Index Terms--Genre/Form:

336502
Electronic books.

LC Class. No.: QC611.8.A5 / M55 2010

Dewey Class. No.: 537.6223

Trap level spectroscopy in amorphous semiconductors[electronic resource] /
LDR:01983cam 2200325Ia 4500 001 353438
003 OCoLC
005 20111122091400.0
006 m d
007 cr cn|||||||||
008 120110s2010 enka o 000 0 eng d
020 $a 9780123847157
020 $a 012384715X
029 1 $a NZ1 $b 13517264
035 $a (OCoLC)647765364
035 $a ocn647765364
037 $a 1098708:10929071 $b Elsevier Science & Technology $n http://www.sciencedirect.com
040 $a OPELS $b eng $c OPELS $d CDX $d OCLCQ
049 $a TEFA
050 4 $a QC611.8.A5 $b M55 2010
082 0 4 $a 537.6223 $2 22
100 1 $a Mikla, Victor I. $3 445822
245 1 0 $a Trap level spectroscopy in amorphous semiconductors $h [electronic resource] / $c Viktor I. Mikla.
260 $a Oxford : $b Elsevier, $c 2010.
300 $a 1 online resource.
505 0 $a Thermally stimulated depolarization currents in amorphous chalcogenides -- Carrier transport processes in amorphous solids -- Time-of-flight experiments in amorphous chalcogenide semiconductors -- Xerographic spectroscopy of states in mobility gap -- Photoinduced effects on states in the mobility gap -- Spectroscopic studies of gap states and laser-induced structural transformations in se-based as-free amorphous semiconductors.
520 $a Although amorphous semiconductors have been studied for over four decades, many of their properties are not fully understood. This book discusses not only the most used spectroscopic techniques but also describes their advantages and disadvantages. Provides information on the most�common spectroscopic techniques Discusses the advantages and disadvantages of each technique.
588 $a Description based on print version record.
650 0 $a Amorphous semiconductors $x Spectra. $3 445823
650 0 $a Amorphous semiconductors $x Defects $x Analysis. $3 445824
650 0 $a Deep level transient spectroscopy. $3 445825
655 4 $a Electronic books. $2 local $3 336502
776 0 8 $i Print version: $a Mikla, Victor I. $t Trap level spectroscopy in amorphous semiconductors. $d Oxford : Elsevier, 2010 $z 9780123847157 $z 012384715X $w (OCoLC)567148516
856 4 0 $3 ScienceDirect $u http://www.sciencedirect.com/science/book/9780123847157
938 $a Coutts Information Services $b COUT $n 14358566
994 $a C0 $b TEF

筆 0 讀者評論

多媒體

多媒體檔案
http://www.sciencedirect.com/science/book/9780123847157

評論

新增評論分享你的心得

Export

取書館別