书封
Wang, Laung-Terng.
概要
| 作品: | 6 作品在 0 项出版品 0 种语言 | |
|---|---|---|
书目信息
System-on-chip test architectures[electronic resource] :nanometer design for testability /
by:
ScienceDirect (Online service); Stroud, Charles E.; Touba, Nur A.; Wang, Laung-Terng.
(书目-语言数据,印刷品)
VLSI test principles and architectures[electronic resource] :design for testability /
by:
Wang, Laung-Terng.; Wen, Xiaoqing.; Wu, Cheng-Wen, (EE Ph. D.)
(书目-语言数据,印刷品)
Electronic design automation[electronic resource] :synthesis, verification, and test /
by:
Chang, Yao-Wen.; Cheng, Kwang-Ting, (1961-); ScienceDirect (Online service); Wang, Laung-Terng.
(书目-语言数据,印刷品)
主题
Electronic circuit design
Circuits int�egr�es �a tr�es grande �echelle
Integrated circuits / Very large scale integration / Testing.
VLSI.
COMPUTERS
Integrated circuits / Very large scale integration / Design.
Computer-aided design.
TECHNOLOGY & ENGINEERING
Circuitos integrados vlsi.
Testen.
Systems on a chip
Integrated circuits